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> Estek wis 600 wafer inspection system 3 - 6 inch wafers
Estek wis 600 wafer inspection system 3 - 6 inch wafers
Designed to completely analyze substrates, films and oxides used in the manufacture of semiconductors. Dark and light channel system. Dark channel is used for detecting particles and any light scattering defects. Light channel is useful for detecting non-light scattering defects such as mounds, dimples and non uniformity. Detects specular flaws, including large particles, mounds, dimples, saw marks, grooves, fractures, slip, epi-spikes, small particles on large grained surfaces, particles buried in/under a film. Detection 0.30 um or .20 um(optional) on Silicon at 95% capture rate. Verified by NIST Traceable Standards.
Includes: Computer Monitor and Stand
Manufacturers Representative Specializing in New/Remanufactured Semiconductor Equipment.
NOTE: The photo of this unit is not good. We are working on a better one.
This item was purchased for resale and was NOT used by seller.
This item can be previewed and inspected by appointment only at our location in Northern, CA. If you have any questions, please call us at (***) 734-9043.
Note: Merchandise will be held until funds clear.
Pick-up location: Northern, CA (Located at our Northern, CA warehouse)
Merchandise must be paid for within 3 days.
EMAIL: ****@earthlink.net
